The Wafer Profiler CVP21 is a handy tool to measure doping profiles in semiconductor layers by Electrochemical Capacitance Voltage Profiling (ECV-Profiling, CV-Profiling) in semiconductor research or production. This ECV Profiler (CV-Profiler, C-V-Profiler) furthermore is a very good choice to analyze or develop strategies for Photo-Electrochemical Wet Etching (PEC-Etching) of semiconductors
TLM-SCAN+ Contact resistivity and more This compact instrument measures contact resistivity, finger line resistance, finger width, and finger height of a finished solar cell or on test structures. Motorized in all axes it is capable of creating maps of all these methods by pushing a single button. Four point probe heads for measuring the sheet resistance of thin diffused layers and resistivity of wafers make the TLM-SCAN+ a low-cost yet fast and high-quality four-point-probe mapper.
