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特性 根据IEC 62804-TS标准方法 易于使用的台式设备 能够测量c-Si太阳能电池和微型模块 无需气候室 不需要电池层压 测量速度：小时到天 可测量参数：分流电阻、功率损耗、电导率、泄漏电流、湿度和温度 太阳能电池可以通过EL等进行研究 基于IP的系统允许在世界任何地方进行远程操作和技术支持

Sinton离线晶片少子寿命测试仪 WCT-120 WCT仪器展示Sinton独特的测量和分析技术，包括半标准准稳态光电导系数（QSSPC)测量方法，该方法由Sinton公司在1994年研发。 载流子合复寿命经过准确校准的测量方式，广泛应用于太阳能单晶和多晶硅片。

The Wafer Profiler CVP21 is a handy tool to measure doping profiles in semiconductor layers by Electrochemical Capacitance Voltage Profiling (ECV-Profiling, CV-Profiling) in semiconductor research or production. This ECV Profiler (CV-Profiler, C-V-Profiler) furthermore is a very good choice to analyze or develop strategies for Photo-Electrochemical Wet Etching (PEC-Etching) of semiconductors

$50 Gift Card. Gift Cards must be redeemed through our site Web site toward the purchase of eligible products.

Classic and elegant gemstone necklace now available in our store

Pill 2.0 Portable Bluetooth Speaker (1-Piece): Watch your favorite movies and listen to music with striking sound quality. This lightweight, portable speaker is easy to take with you as you travel to any destination, keeping you entertained wherever you are.